nhờ bạn lấy giúp bài:
- A study of deep-submicron MOSFET scaling based on experiment and simulation
http://dx.doi.org/10.1109/16.372070
- An accurate gate length extraction method for sub-quarter micron MOSFET's
http://dx.doi.org/10.1109/16.502130
- Determination of ultra-thin gate oxide thicknesses for CMOS structures using quantum effects
http://dx.doi.org/10.1109/IEDM.1994.383335
- Accurate Back-of-the-Envelope Transistor Model for Deep Sub-micron MOS
http://dx.doi.org/10.1109/MSE.2007.17
- Nano-scale MOSFET: Comments on different ballistic models and device simulation
http://dx.doi.org/10.1109/CCCA.2011.6031438
- Inverse modeling of MOSFETs using I-V characteristics in the subthreshold region
http://dx.doi.org/10.1109/IEDM.1997.650475